Simple method for the preparation of InP based samples for TEM investigation.
Identifieur interne : 005181 ( Main/Exploration ); précédent : 005180; suivant : 005182Simple method for the preparation of InP based samples for TEM investigation.
Auteurs : RBID : pubmed:1880605English descriptors
- KwdEn :
- MESH :
- chemical : Argon, Fixatives, Indium, Iodine.
- methods : Microscopy, Electron.
- Semiconductors, Surface Properties.
Abstract
A novel, rapid, and simple method is described for the preparation of InP based samples for investigation by transmission electron microscopy (TEM). The key feature of the technique is Ar+ ion bombardment in an iodine ambient. Cross sectional micrographs of Au/InP samples are shown as an example. The technique developed produces a large area of transparent region.
DOI: 10.1002/jemt.1060180315
PubMed: 1880605
Links toward previous steps (curation, corpus...)
Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en">Simple method for the preparation of InP based samples for TEM investigation.</title><author><name sortKey="Barna, A" uniqKey="Barna A">A Barna</name><affiliation wicri:level="3"><nlm:affiliation>Research Institute for Technical Physics, Hungarian Academy of Sciences, Budapest.</nlm:affiliation><country>Hongrie</country><placeName><settlement type="city">Budapest</settlement><region nuts="2">Hongrie centrale</region></placeName><wicri:orgArea>Research Institute for Technical Physics, Hungarian Academy of Sciences</wicri:orgArea></affiliation></author><author><name sortKey="Pecz, B" uniqKey="Pecz B">B Pécz</name></author></titleStmt><publicationStmt><date when="1991">1991</date><idno type="RBID">pubmed:1880605</idno><idno type="pmid">1880605</idno><idno type="doi">10.1002/jemt.1060180315</idno><idno type="wicri:Area/Main/Corpus">005595</idno><idno type="wicri:Area/Main/Curation">005595</idno><idno type="wicri:Area/Main/Exploration">005181</idno></publicationStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Argon</term><term>Fixatives</term><term>Indium</term><term>Iodine</term><term>Microscopy, Electron (methods)</term><term>Semiconductors</term><term>Surface Properties</term></keywords><keywords scheme="MESH" type="chemical" xml:lang="en"><term>Argon</term><term>Fixatives</term><term>Indium</term><term>Iodine</term></keywords><keywords scheme="MESH" qualifier="methods" xml:lang="en"><term>Microscopy, Electron</term></keywords><keywords scheme="MESH" xml:lang="en"><term>Semiconductors</term><term>Surface Properties</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">A novel, rapid, and simple method is described for the preparation of InP based samples for investigation by transmission electron microscopy (TEM). The key feature of the technique is Ar+ ion bombardment in an iodine ambient. Cross sectional micrographs of Au/InP samples are shown as an example. The technique developed produces a large area of transparent region.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="MEDLINE"><PMID Version="1">1880605</PMID><DateCreated><Year>1991</Year><Month>10</Month><Day>01</Day></DateCreated><DateCompleted><Year>1991</Year><Month>10</Month><Day>01</Day></DateCompleted><DateRevised><Year>2013</Year><Month>11</Month><Day>21</Day></DateRevised><Article PubModel="Print"><Journal><ISSN IssnType="Print">0741-0581</ISSN><JournalIssue CitedMedium="Print"><Volume>18</Volume><Issue>3</Issue><PubDate><Year>1991</Year><Month>Jul</Month></PubDate></JournalIssue><Title>Journal of electron microscopy technique</Title><ISOAbbreviation>J Electron Microsc Tech</ISOAbbreviation></Journal><ArticleTitle>Simple method for the preparation of InP based samples for TEM investigation.</ArticleTitle><Pagination><MedlinePgn>325-8</MedlinePgn></Pagination><Abstract><AbstractText>A novel, rapid, and simple method is described for the preparation of InP based samples for investigation by transmission electron microscopy (TEM). The key feature of the technique is Ar+ ion bombardment in an iodine ambient. Cross sectional micrographs of Au/InP samples are shown as an example. The technique developed produces a large area of transparent region.</AbstractText></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Barna</LastName><ForeName>A</ForeName><Initials>A</Initials><Affiliation>Research Institute for Technical Physics, Hungarian Academy of Sciences, Budapest.</Affiliation></Author><Author ValidYN="Y"><LastName>Pécz</LastName><ForeName>B</ForeName><Initials>B</Initials></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType>Journal Article</PublicationType></PublicationTypeList></Article><MedlineJournalInfo><Country>UNITED STATES</Country><MedlineTA>J Electron Microsc Tech</MedlineTA><NlmUniqueID>8502171</NlmUniqueID><ISSNLinking>0741-0581</ISSNLinking></MedlineJournalInfo><ChemicalList><Chemical><RegistryNumber>0</RegistryNumber><NameOfSubstance>Fixatives</NameOfSubstance></Chemical><Chemical><RegistryNumber>045A6V3VFX</RegistryNumber><NameOfSubstance>Indium</NameOfSubstance></Chemical><Chemical><RegistryNumber>67XQY1V3KH</RegistryNumber><NameOfSubstance>Argon</NameOfSubstance></Chemical><Chemical><RegistryNumber>9679TC07X4</RegistryNumber><NameOfSubstance>Iodine</NameOfSubstance></Chemical></ChemicalList><CitationSubset>IM</CitationSubset><MeshHeadingList><MeshHeading><DescriptorName MajorTopicYN="N">Argon</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Fixatives</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="Y">Indium</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Iodine</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="Y">Microscopy, Electron</DescriptorName><QualifierName MajorTopicYN="N">methods</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Semiconductors</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Surface Properties</DescriptorName></MeshHeading></MeshHeadingList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="pubmed"><Year>1991</Year><Month>7</Month><Day>1</Day></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>1991</Year><Month>7</Month><Day>1</Day><Hour>0</Hour><Minute>1</Minute></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>1991</Year><Month>7</Month><Day>1</Day><Hour>0</Hour><Minute>0</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pubmed">1880605</ArticleId><ArticleId IdType="doi">10.1002/jemt.1060180315</ArticleId></ArticleIdList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=IndiumV2/Data/Main/Exploration
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 005181 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd -nk 005181 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien
|wiki= *** parameter Area/wikiCode missing ***
|area= IndiumV2
|flux= Main
|étape= Exploration
|type= RBID
|clé= pubmed:1880605
|texte= Simple method for the preparation of InP based samples for TEM investigation.
}}
Pour générer des pages wiki
HfdIndexSelect -h $EXPLOR_AREA/Data/Main/Exploration/RBID.i -Sk "pubmed:1880605" \
| HfdSelect -Kh $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd \
| NlmPubMed2Wicri -a IndiumV2
| This area was generated with Dilib version V0.5.76. |  |